The DP5700 Series power supplies include standard GPIB, LAN, and USB 2.0 interfaces, providing flexibility in I/O selection across test systems. The series is fully compliant with the LXI Class C specification.

All DP5700 models include a removable SD card option for secure data handling in classified environments. This option supports equipment sanitization and enables detailed record-keeping of cleaning and sanitization processes, including the methods and materials used, to maintain a clear audit trail and ensure accountability.

Voltage and current can be programmed from zero to full scale using either an analog voltage of 0 - 5V / 0 - 10V or a resistance of 0 - 5 kΩ / 0 - 10 kΩ. This capability also enables monitoring of voltage and current signals.

The integrated arbitrary generator enables the creation of complex voltage or current waveforms that replicate real-world operating environments. Users can apply customized waveforms to simulate power fluctuations, transient events, or other dynamic scenarios, allowing comprehensive device performance characterization.

The arbitrary generator can be synchronized with other test instruments to support coordinated testing setups, making it ideal for evaluating system-level behavior. Additionally, it can reproduce dynamic load conditions often encountered in real applications, ensuring devices are tested under realistic and demanding circumstances.

The DP5700 Series offers adjustable slew rate control to manage the rate of voltage change during operation. By fine-tuning the slew rate, users can minimize voltage overshoot and spikes, ensuring smooth transitions and stable power delivery.

Slew control enhances the power supply’s ability to handle sudden load changes, improving load transient response and overall power delivery efficiency. This level of control is especially valuable when testing sensitive devices that require carefully managed power ramp-up or ramp-down behavior.